- JEOL JXA-8530F Electron Microprobe
The JEOL was delivered in March 2013, it is the workhorse of the lab.
It would make a fabulous SEM because of its field emission electron source, but of course has rather limited stage movement because of its main mission which is x-ray analysis. To that end, it has five WDS spectrometers, all with large area crystals. It also has a Thermo Noran System 7 SDD-EDS system. Control is through JEOL, Probe for EPMA, or Thermo-NSS software depending on the need. Finally, it has a cathodoluminescence (CL) detector which can accommodate a variety of filters for specific wavelength detection.
Acquisition of the instrument was supported by the National Science Foundation under Grant Number 1126898. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. Contact uaf-ail@alaska.edu for details.
- FEI Quanta 200 Environmental Scanning Electron Microscope
The FEI Quanta200 can b
e operated in regular high-vacuum, low-vacuum and full environmental ESEM modes for imaging many varieties of samples. Low-vacuum mode allows samples to be imaged that are uncoated utilizing a low vacuum SE detector and an optional BSE detector. ESEM mode can image wet, uncoated samples and samples can be heated or cooled with a Peltier stage. The Quanta200 is equipped with iXRF software/hardware and an e2v SSD EDS detector which can measure >300,000 x-ray counts/second. Contact uaf-ail@alaska.edu for details.- JEOL 6510 Scanning Electron Microscope
The JEOL 6510 SEM was generously donated to AIL by the USGS Alaska
Science Center in 2024. It can be operated in regular high-vacuum and low-vacuum modes similarly to the ESEM, but can only image using the BSE detector in low-vacuum mode. The JEOL 6510 SEM also contains a rapid cathodoluminescence (CL) detector and iXRF software/hardware and an e2v SSD EDS detector similar to the ESEM system. Contact uaf-ail@alaska.edu for details.- PanAlytical Axios X-ray Fluorescence Spectrometer
Our PanAlytical Axios four kilowatt wavelength dispersive XRF is used for quantitative analysis of bulk samples (approximately 10 grams) to the ppm level. Contact uaf-ail@alaska.edu for details. 
- PANalytical X'Pert MRD Material Research Diffractometer
Our PANalytical X'Pert MRD Material Research Diffractometer (MRD) x-ray diff
ractometer has many options and can be used for conventional and high resolution/quantitative powder x-ray diffraction, surface and thin film diffraction, and texture analysis. Contact uaf-ail@alaska.edu for details.- Renishaw inVia Qontor Raman Microscope
The Renishaw Qontor inVia microscope comprises a research-grade Leica micro
scope coupled to a high-performance Raman spectrometer. The Leica microscope is capable of both reflected and transmitted microscopy and is equipped with an automated 3-axis stage and four primary objective lenses for both short and long working distances. The IR system consists of two separate laser options, including a 50 mW 532 nm green wavelength laser ideal for mineral and glass analyses, as well as a 100 mW 785 nm near-IR laser utilized for microplastics and organic molecular analyses. The high performance lasers coupled with the automated microscope stage and built in linear encoding system allows for high resolution (~1 micron) automated 2D and sub-surface 3D compositional mapping of samples. The instrument is also optimized to analyze water and carbon dioxide in glasses and fluid inclusions.- Thermo Scientific Nicolet 6700 Fourier Transform Infrared Spectrometer
FTIR Thermo S
cientific Nicolet 6700 with attached continuum microscope. Capable of high-resolution infrared spectra of volatile species in volcanic glasses, snow/ice impurities and aerosols. Measures the attenuated total reflectance of sample surfaces. Contact Jess Larsen for details.